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Figure 9
Diffraction patterns obtained from NIST standards: (a) LaB6, (b) CeO2 and (c) Si. The conditions (acquisition time, detector position, collimator slit gap) are indicated for all patterns. Peak fitting (symmetric pseudo Voigt) and FWHM calculations were carried out using the software PDIndexer (Seto et al., 2010BB38).

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SYNCHROTRON
RADIATION
ISSN: 1600-5775
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