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Figure 13
Crack path for the high-temperature test for slices taken every 630 µm (the Greek letters correspond to the slice positions as plotted in Fig. 5 ). (a) Initial state. (e) At last step before failure. (f) After failure. |
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Figure 13
Crack path for the high-temperature test for slices taken every 630 µm (the Greek letters correspond to the slice positions as plotted in Fig. 5 ). (a) Initial state. (e) At last step before failure. (f) After failure. |