A wide-field micro-computed tomography detector: micron resolution at half-centimetre scale

Yakovlev, M.A.; Vanselow, D.J.; Ngu, M.S.; Zaino, C.R.; Katz, S.R.; Ding, Y.; Parkinson, D.; Wang, S.Y.; Ang, K.C.; La Riviere, P.; Cheng, K.C.

doi:10.1107/S160057752101287X

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Figure 5
Slanted edge response and calculation of MTF in the projection domain. A 400 projection series taken at the same angle of the indicated area of the slanted L edge (a) was used to record the associated averaged intensity line profile (b). The LSF (c) was taken as the first derivative of (b) across pixel distance, and the MTF (d) was calculated as the discrete normalized Fourier transform of the portion of (c) covering the edge. The full width at half-maximum amplitude of the LSF was recorded at 0.90 µm (c), with the indicated 0.1 MTF amplitude located at 0.87 line pairs per µm (d). Line pairs are presented with a corresponding averaged intensity line profile indicating contrast within the 10, 5, 4, 3, 2 and 1 µm line pair groups (e). Edge enhancement can be visualized most easily in the intensity profile region corresponding to the 10 µm demarcations.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 2| March 2022| Pages 505-514

https://doi.org/10.1107/S160057752101287X

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