Figure 5
(a) Raw data measured on the GaAs powder, simultaneously, through the As Kα, Ga Kα and absorption channels at the As K-edge. (b) Raw Ga Kα data measured on the GaAs wafer for various incidence angles. The As Kα data at α = 5° is given to show its correlation with Ga Kα. The insert shows the details of the secondary emission edge step induced by the As Kα emisson. |