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Figure 5
Characterizations of the focusing performance of the fabricated Au-TKZP. (a) The focusing beam profiles of the Au-TKZP lens, measured by the knife-edge scanning method with dwell time of 100 ms and step size of 100 nm. The dotted line is the raw data, the solid line in black is the least-squares fitting curve and the red line is the first derivative of the fitted scanning curve, giving rise to a the full width at half-maximum of 263 nm for the Au-TKZP lens. (b) The measured focusing efficiencies of Au-TKZP and Au FZP. For comparison, their corresponding theoretical figures are also presented. The efficiency labeled TKZP+ was calculated from the actual zone profiles. (c) SEM image (left) of the in-house-made Siemens stars with minimal resolution of 100 nm and X-ray image (right) of the same target at 8 keV with a dwelling time of 100 ms and step size of 150 nm.

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