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Figure 3
SXDM phase-contrast images of a test pattern for (a) externally triggered (ET) and (b) free-run (FR) data collection with interpolated positions. (c) An SEM image of the centre of the test pattern. Insets (d)–(f) are taken from the area depicted by the red box in panel (a), showing that FR data collection allows higher quality reconstruction of the finest details in the test object. The scale bars in panels (a) and (d) correspond to 2 µm and 500 nm, respectively, and the grey scale in panel (b) indicates the quantitative phase delay in radians.

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