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![[Figure 1]](ok5069fig1mag.jpg)
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Figure 1
Schematic of the experimental setup used to perform milli-electronvolt inelastic X-ray scattering at the MEC endstation at the LCLS. X-ray pulses at 10.896 keV are first monochromated using a four-bounce (931) silicon monochromator arranged in a non-dispersive configuration and positioned at a glancing angle of incidence of 87.9°. Monochromatic X-ray pulses are then incident on a 50 µm-thick PMMA sample. Scattered photons are finally collected by four diced (931) silicon analysers and focused on an ePix100 detector (Carini et al., 2016  ). The sample is oriented at a 22° angle such that the scattering vector Q is parallel to the [010] crystallographic direction at the 44° analyser location. The inset shows the raw data collected for each analyser. The curvature of the traces at Q = 4.1 Å−1 and Q = 4.8 Å−1 is postulated to arise from defocusing effects as these analysers could not be positioned at best focus. |
![[Figure 1]](ok5069fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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