view article

Figure 5
(a) Inelastic X-ray scattering spectrum recorded on a 50 nm-thick textured Au sample at 2.1 Å−1 and at ambient conditions (black) along with ray-tracing simulations (orange). The measured instrument function is shown in gray for comparison. (b) Calculated thermal diffuse scattering intensity, ITDS, for equation (2)[link] normalized by the value at 2.1 Å−1 (22°) (black) along with the experimentally recorded number of photons on the detector, NDet, normalized by the value at 2.1 Å−1 (orange squares).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds