Figure 5
(a) Inelastic X-ray scattering spectrum recorded on a 50 nm-thick textured Au sample at 2.1 Å−1 and at ambient conditions (black) along with ray-tracing simulations (orange). The measured instrument function is shown in gray for comparison. (b) Calculated thermal diffuse scattering intensity, ITDS, for equation (2) normalized by the value at 2.1 Å−1 (22°) (black) along with the experimentally recorded number of photons on the detector, NDet, normalized by the value at 2.1 Å−1 (orange squares). |