Figure 3
(a) Powder XRD and (b) GIXS profiles of ZnO nanorods along the out-of-plane Qz and in-plane Qx directions, respectively. The GIXS profile is measured at an incident angle of 0.2°. The scan directions in Qx–Qz reciprocal space are illustrated in the in-set. The (0001) and atomic planes of hexagonal wurtzite ZnO are aligned with the Qz and Qx directions, respectively. |