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Figure 7
Cr and Si distributions in the bilayer sample as obtained as a function of sputtering time from SIMS measurement. Only the Cr–SiO2 region is shown.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 29| Part 4| July 2022| Pages 978-984
https://doi.org/10.1107/S1600577522004738
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