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Figure 2
Normalized XEOL spectra measured at several selected X-ray energies across the Cu K-edge (EK = 8979 eV) at 10 K on a polycrystalline CuInSe2 thin film grown on a Mo-coated soda-lime glass substrate. The inset schematically illustrates the polycrystalline character of the sample with color code, the sample orientation relative to the polarization vector E of the incident X-ray beam and the direction of the collected XEOL signal. The assignments of the emission bands are based on PL studies (Babbe et al., 2019BB1; Spindler et al., 2019BB25), with the definition of the abbreviations given in Section 3.2[link].

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