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![[Figure 2]](ok5078fig2mag.jpg)
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Figure 2
Normalized XEOL spectra measured at several selected X-ray energies across the Cu K-edge (EK = 8979 eV) at 10 K on a polycrystalline CuInSe2 thin film grown on a Mo-coated soda-lime glass substrate. The inset schematically illustrates the polycrystalline character of the sample with color code, the sample orientation relative to the polarization vector E of the incident X-ray beam and the direction of the collected XEOL signal. The assignments of the emission bands are based on PL studies (Babbe et al., 2019  ; Spindler et al., 2019), with the definition of the abbreviations given in Section 3.2. |
![[Figure 2]](ok5078fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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