view article
Figure 3
Normalized XEOL spectra measured at several selected X-ray energies across the Zn K-edge (EK = 9659 eV) at 10 K on a single-crystalline ZnO-[(11\bar20)] wafer. The inset schematically illustrates the sample orientation relative to the polarization vector E of the incident X-ray beam and the direction of the collected XEOL signal. Note that the measurement geometry corresponds to E ⊥ c (perpendicular) polarization mode. The emission bands are labeled based on PL studies (von Wenckstern et al., 2007aBB31,bBB32; Wagner et al., 2011BB28), with the definition of the abbreviations given in Section 3.3[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 29| Part 5| September 2022| Pages 1209-1215
https://doi.org/10.1107/S1600577522007287
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS