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Figure 3
Normalized XEOL spectra measured at several selected X-ray energies across the Zn K-edge (EK = 9659 eV) at 10 K on a single-crystalline ZnO-[(11\bar20)] wafer. The inset schematically illustrates the sample orientation relative to the polarization vector E of the incident X-ray beam and the direction of the collected XEOL signal. Note that the measurement geometry corresponds to E ⊥ c (perpendicular) polarization mode. The emission bands are labeled based on PL studies (von Wenckstern et al., 2007aBB31,bBB32; Wagner et al., 2011BB28), with the definition of the abbreviations given in Section 3.3[link].

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