journal menu
![[Figure 8]](ok5080fig8mag.jpg)
|
|
Figure 8
(a) Micrograph of the t-DAC assembly loaded with Au and Ne at ∼65 GPa. The darker area inside the sample chamber corresponds to Au powder, while the brighter area, illuminated by back light, corresponds to Ne. (b) 2D X-ray diffraction pattern collected at ∼247 GPa [pressure determined by the third-order Birch–Murnaghan EoS (BM3-EoS) of Ne from Fei et al. (2007  )] with indication of (111) peaks of Au and Ne. Strong diamond peaks are indicated separately. (c) 1D diffraction pattern corresponding to (b). With respect to the X-ray background signal on the 1D pattern, we observe a continuous variation of intensity attributed to the contribution from Compton scattering of the diamond anvils and a negligible contribution from the amorphous gasket. The raw data corresponding to I (obs) are indicated with a dark blue line; the light blue line corresponds to the raw data with background intensity I (bkg) subtracted. Black/red and orange ticks shown under the 1D pattern indicate peak positions for Au and Ne, respectively. The black ticks correspond to Au hkl reflections with Le Bail fit, while the red ticks indicate diffraction peak positions of Au fitted individually. The pressure values were estimated by different Ne EoSes. |
![[Figure 8]](ok5080fig8.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
Open 
access
access
