A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

Nazaretski, E.; Coburn, D.S.; Xu, W.; Ma, J.; Xu, H.; Smith, R.; Huang, X.; Yang, Y.; Huang, L.; Idir, M.; Kiss, A.; Chu, Y.S.

doi:10.1107/S1600577522007056

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Figure 2
Measurement results of the SRX KB mirrors using the NSP instrument: (a) slope profiles, (b) height profiles, integrated using the slope measurement.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 5| September 2022| Pages 1284-1291

https://doi.org/10.1107/S1600577522007056

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