A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

Nazaretski, E.; Coburn, D.S.; Xu, W.; Ma, J.; Xu, H.; Smith, R.; Huang, X.; Yang, Y.; Huang, L.; Idir, M.; Kiss, A.; Chu, Y.S.

doi:10.1107/S1600577522007056

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Figure 3
Residual slope errors of the vertical KB are evaluated with best ellipse fitting. The residual slope error is 57 nrad RMS when the mirror is measured without the mirror holder. When the mirror is measured with its holder, the residual slope error slightly increases to 68 nrad RMS. A vertical shift is added for better visualization and comparison.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 5| September 2022| Pages 1284-1291

https://doi.org/10.1107/S1600577522007056

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