A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

Nazaretski, E.; Coburn, D.S.; Xu, W.; Ma, J.; Xu, H.; Smith, R.; Huang, X.; Yang, Y.; Huang, L.; Idir, M.; Kiss, A.; Chu, Y.S.

doi:10.1107/S1600577522007056

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Figure 4
Overview of the KB manipulation system. Panels (a), (d), (e), (f), and (g) represent CAD models of various components. 1 – Invar base supporting both vertical and horizontal KB mirrors; 2 – vertical KB mirror assembly; 3 – horizontal KB mirror assembly; 4 – Invar reference frame for laser interferometer heads used to monitor/encode the position of the mirrors; 5 – coarse and fine actuators used to angularly align both mirrors; 6 – retroreflectors used in conjunction with the laser interferometer heads; 7 – flexure for the vertical KB mirror; 8 – flexure for the horizontal KB mirror. Panels (b) and (c) are the photographs of the installed system.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 5| September 2022| Pages 1284-1291

https://doi.org/10.1107/S1600577522007056

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