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Figure 3
Beam profile at the sample position of the MAXPEEM beamline. (a) Simulation using X-ray tracing software (Klementiev & Chernikov, 2014BB15), photon energy 40 eV; the energy slit is 150 µm (H) × 150 µm (V). The color code is the energy dispersion that scales with the photon energy. It is ±7 meV at 40 eV photon energy. (b) Experimental beam profile in the photoelectron microscope at 43 eV photon energy. The beamline energy slit is 150 µm × 150 µm and the signal is from secondary photoelectrons discriminated by the energy analyzer of the microscope, with an energy window of 0.2 eV.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 2| March 2023| Pages 468-478
https://doi.org/10.1107/S160057752300019X
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