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Figure 6
(a) LEEM and (b) micro-spot LEED images from an epitaxial mono-/bi-layer graphene sample grown on SiC to show the resolution and dynamic range of TVIPS-F216. The image size of (a) is 20 µm × 20 µm. The upper inset in (a) is the magnified image of the area selected in red (1484 nm × 1484 nm) and the profile across the mono-/bi-layer boundary (yellow line) is shown in the lower inset of (a). The resolution of the detector is determined to be about 2.1 pixels, which corresponds to 32.8 nm. The inset in (b) shows the profile along the red line across the LEED spots [note that panel (b) is given on a logarithmic scale].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 2| March 2023| Pages 468-478
https://doi.org/10.1107/S160057752300019X
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