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Figure 8
High-resolution secondary (a) XPEEM and (b) LEEM images of Sn/SnOx intercalated graphene. For the XPEEM image, every frame was acquired with 1 s exposure time in the stack of 185 images. Before integration, the images in the stack were drift-corrected. For the LEEM image, the image was integrated from eight frames with 1 s exposure time without drift correction (note that the single step is clearly visible in both images).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 2| March 2023| Pages 468-478
https://doi.org/10.1107/S160057752300019X
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