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Figure 9
Space-charge effects manifested in the XPEEM images obtained under different conditions. Top row: secondary XPEEM images: (a) high photon flux of 4.2 × 1013 photons s−1, (b) low photon flux of 1.4 × 1013 photons s−1 in the mirror-off mode, (c) same as (b) but in the mirror-on mode, (d) same as (c) with insertion of the SAA (100 µm). Lower row: Si2p core-level XPEEM images, (e) same as (c), (f) with the SAA inserted, (g) with the knife aperture inserted (no SAA), and (h) with both the SAA and the knife inserted. All XPEEM images presented are 2.5 µm × 2.5 µm, cropped from raw images with FoV = 10 µm. The sample is monolayer graphene with a few bilayer islands grown on SiC (0001). In the mirror-on (mirror-off) mode, the 70 µm (30 µm) CA was always used. The photon energy used for all images was 150 eV. The integration time for (a)–(d) was 3.2 s and (e)–(h) was 320 s.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 2| March 2023| Pages 468-478
https://doi.org/10.1107/S160057752300019X
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