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Figure 2
(a) Measurement setup for X-ray micro-lamino­graphy of planar specimens. In this photograph, the tilt angle of the rotational axis was set to 30° from the normal direction to the X-ray beam. (b) Schematic drawing of the wide FOV observation with a vertical sample scan.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 2| March 2023| Pages 400-406
https://doi.org/10.1107/S1600577522012176
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