Figure 7
Radial averages of an amorphous scatterer measured using a Pilatus 2M CdTe detector, with the detector translated slightly between measurements that have been corrected with (a) the factory detector FFC and (b) a recently calculated FFC. The measurements have different relative peak intensities when corrected with the factory FFC which cannot correspond to the sample structure, indicating that the detector flat-field response has changed over time. Intensities on the vertical axes are arbitrary, so no numbers are shown. Vertical magnification of the inset is 2×. |