Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging

Gao, Z.; Fan, J.; Tong, Y.; Zhang, J.; He, B.; Nie, Y.; Luan, H.; Lu, D.; Zhang, D.; Yuan, X.; Wang, Y.; Liu, Z.; Jiang, H.

doi:10.1107/S1600577523000887

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Figure 2
Determination of the largest size of the sample by observing the interference fringes. (a) Circular Gaussian beam amplitude. The spot has a size ω = 2.12 µm, 3 µm FWHM_A and a peak amplitude of 1 (arbitrary units). The pattern has 3605 × 3605 pixels. (b) Sample multiplied by beam amplitude. The sample is composed of two identical gold nanoparticles with 200 nm diameter; one is at the center of the spot and the other is at a distance d. (c) Logarithmic diffraction intensity pattern from the sample in (b) illuminated by the beam in (a). (d) Line scan of the white dotted line in (c). The normalized line scan results with different d show interference fringes.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 3| May 2023| Pages 505-513

https://doi.org/10.1107/S1600577523000887

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