Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging

Zhang, Y.; Porter, J.N.; Wilkin, M.J.; Harder, R.; Cha, W.; Suter, R.M.; Liu, H.; Schnebly, L.; Sandberg, R.L.; Miller, J.A.; Tischler, J.; Pateras, A.; Rollett, A.D.

doi:10.1107/S160057752300365X

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Figure 3
Image processing workflow of the scanning Laue diffraction microscopy method including data collection, and automated data analysis. Panel (a) is an example of a diffraction pattern measured on an Au crystal. Panel (b) shows the background calculated from the pixel-wise median value of the intensity. Panel (c) shows the background corrected by applying the rolling ball algorithm to the background. Panel (d) shows the removed substrate peaks denoted by the red line, which correspond to the zero-intensity regions, previously visible as bright peaks in images (a)–(c). In addition, the identified Au peaks are highlighted with a yellow outline.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 4| July 2023| Pages 796-806

https://doi.org/10.1107/S160057752300365X

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