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Figure 5
High- and low-Z reference sample nano-imaging by the two resolution modes. (a–c) Image of a high-Z material – gold particles. (a) A 2D slice of the gold particles with 20 µm field of view taken at 8 keV. (b) A rending of the 3D structure of a local region. (c) The same batch of gold particles imaged with SEM. (d–e) Image of a low-Z material – SiO2 powder. (d) A 2D slice of the SiO2 with 20 µm field of view taken at 5.2 keV. (e) A rending of the 3D structure of a local region. (f) The same batch of SiO2 powders imaged with SEM.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 4| July 2023| Pages 815-821
https://doi.org/10.1107/S1600577523003168
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