A MHz X-ray diffraction set-up for dynamic compression experiments in the diamond anvil cell

Husband, R.J.; Strohm, C.; Appel, K.; Ball, O.B.; Briggs, R.; Buchen, J.; Cerantola, V.; Chariton, S.; Coleman, A.L.; Cynn, H.; Dattelbaum, D.; Dwivedi, A.; Eggert, J.H.; Ehm, L.; Evans, W.J.; Glazyrin, K.; Goncharov, A.F.; Graafsma, H.; Howard, A.; Huston, L.; Hutchinson, T.M.; Hwang, H.; Jacob, S.; Kaa, J.; Kim, J.; Kim, M.; Koemets, E.; Konôpková, Z.; Langenhorst, F.; Laurus, T.; Li, X.; Mainberger, J.; Marquardt, H.; McBride, E.E.; McGuire, C.; McHardy, J.D.; McMahon, M.I.; McWilliams, R.S.; Méndez, A.S.J.; Mondal, A.; Morard, G.; O'Bannon, E.F.; Otzen, C.; Pépin, C.M.; Prakapenka, V.B.; Prescher, C.; Preston, T.R.; Redmer, R.; Roeper, M.; Sanchez-Valle, C.; Smith, D.; Smith, R.F.; Sneed, D.; Speziale, S.; Spitzbart, T.; Stern, S.; Sturtevant, B.T.; Sztuk-Dambietz, J.; Talkovski, P.; Velisavljevic, N.; Vennari, C.; Wu, Z.; Yoo, C.-S.; Zastrau, U.; Jenei, Z.; Liermann, H.-P.

doi:10.1107/S1600577523003910

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Figure 7
Dynamic compression of Ti. (a) Selected integrated diffraction patterns collected during the ramp, (b) integrated XRD data, (c) unit cell volume of α-Ti and (d) voltage applied to the piezo actuator and sample pressure as a function of time. In (a) and (b), G indicates reflections from the gasket. Error bars are shown for every 20th data point in (c).

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ISSN: 1600-5775

Volume 30| Part 4| July 2023| Pages 671-685

https://doi.org/10.1107/S1600577523003910

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