view article

Figure 7
Dynamic compression of Ti. (a) Selected integrated diffraction patterns collected during the ramp, (b) integrated XRD data, (c) unit cell volume of α-Ti and (d) voltage applied to the piezo actuator and sample pressure as a function of time. In (a) and (b), G indicates reflections from the gasket. Error bars are shown for every 20th data point in (c).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds