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Figure 6
(a) Two-circle diffractometer and 13-crystal multi-analyser stage with EIGER2 2M-W detector at the ID22 beamline. (b) LaB6 100 reflection (λ = 0.3542 Å) as a function of the detector pixel columns 31–511. The further from the centerline of the detector, the lower the apparent 2θ angle, and the broader the diffraction peak. The axial resolution provided by the EIGER2 detector allows the 2θ scale to be corrected along with mitigation of the broadening effect.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 4| July 2023| Pages 723-738
https://doi.org/10.1107/S160057752300454X
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