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Figure 1
Comparison of TEM, STXM and ptychography imaging of BN nanobamboo. (a) TEM image of the BN nanobamboo structure. (b) Zoomed-in image of the interface between two panes of the bamboo structure. The dashed line indicates the region where the sheets are aligned perpendicular to the long axis. [Panels (a) and (b) are courtesy of C. Bittencourt.] (c) STXM image of BN nanobamboo structure at 192.0 eV, LH polarization. (d) Ptychography amplitude image of the same BN nanobamboo structure as in (c) (E = 192.0 eV, LH polarization). The yellow `X' marks where the DI presented in Fig. S6 was measured. (e) Phase image of the same area as in (d), derived from the same ptychography data. The yellow arrow in (d) and (e) highlights the significant differences in the details of the nanobamboo structure between the amplitude and phase image.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 4| July 2023| Pages 746-757
https://doi.org/10.1107/S1600577523003399
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