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Figure 5
(a) Focused beam spot at the sample position photographed in the EA01 endstation; E = 265 eV, slits 300 µm (h) × 40 µm (v); its intensity distribution in the horizontal direction is shown above. (b) Profile of the focused beam spot at the sample position obtained from the ray tracing with the same parameters as in (a). (c) Defocused beam spot profile measured as in (a); narrow/on-axis radiation cone used. In the centre, the focused beam from (a) is placed in red for visual comparison.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 4| July 2023| Pages 831-840
https://doi.org/10.1107/S1600577523003429
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