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Figure 2
RMS interface roughness of W/B4C MLs on buffer layers of Cr (red), Pt (blue), [C/Pt] (green) and WSi2 (black) versus buffer layer film thickness. Straight lines correspond to fits using power laws. Open symbols were excluded from the fits.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 4| July 2023| Pages 708-716
https://doi.org/10.1107/S1600577523003697
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