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Figure 1
Scanning procedure in s3DXRD microscopy. The diffraction peaks are measured by translating and rotating the specimen. The rotation center is unchanged during the measurement.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 6| November 2023| Pages 1108-1113
https://doi.org/10.1107/S1600577523008597
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