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![[Figure 1]](ok5100fig1mag.jpg)
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Figure 1
(a) Layout of the XES setup at the XSS hutch of PAL-XFEL. A single-column (4 × 1) von Hamos spectrometer is placed on the horizontal two-theta arm of the two-circle diffractometer with its two-theta angle set to 90° to minimize the elastic background signal from the sample. A JUNGFRAU detector is held on the robot arm that is located above the sample stage. (b) An illustration of the experimental scheme for the von Hamos spectrometer equipped with two Si(660) and two Si(555) analyzer crystals (radius of curvature = 500 mm). The spectrometer and the detector are positioned on the Rowland circle in the vertical diffraction plane. The emitted X-ray photons are dispersed vertically with higher (lower) energy diffracted at a lower (higher) Bragg angle. (c) An averaged 2D detector image of the Ir Lβ2 (4d → 2p3/2) fluorescence of the IrO2 powder sample, which is dispersed vertically and focused horizontally by one analyzer crystal (left panel). The numbers in the left panel denote pixel numbers. The projection of the image onto the vertical line corresponds to the X-ray emission spectrum normalized with the maximum intensity. The fluorescence energy increases upward (right panel). |
![[Figure 1]](ok5100fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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