Online dynamic flat-field correction for MHz microscopy data at European XFEL

Birnsteinova, S.; Ferreira de Lima, D.E.; Sobolev, E.; Kirkwood, H.J.; Bellucci, V.; Bean, R.J.; Kim, C.; Koliyadu, J.C.P.; Sato, T.; Dall'Antonia, F.; Asimakopoulou, E.M.; Yao, Z.; Buakor, K.; Zhang, Y.; Meents, A.; Chapman, H.N.; Mancuso, A.P.; Villanueva-Perez, P.; Vagovič, P.

doi:10.1107/S1600577523007336

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Figure 1
Algorithm overviews of the first part with principal component analysis of the flat-field dataset (a) and the second part performing the online dynamic flat-field correction and visualization (b).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 6| November 2023| Pages 1030-1037

https://doi.org/10.1107/S1600577523007336

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