Online dynamic flat-field correction for MHz microscopy data at European XFEL

Birnsteinova, S.; Ferreira de Lima, D.E.; Sobolev, E.; Kirkwood, H.J.; Bellucci, V.; Bean, R.J.; Kim, C.; Koliyadu, J.C.P.; Sato, T.; Dall'Antonia, F.; Asimakopoulou, E.M.; Yao, Z.; Buakor, K.; Zhang, Y.; Meents, A.; Chapman, H.N.; Mancuso, A.P.; Villanueva-Perez, P.; Vagovič, P.

doi:10.1107/S1600577523007336

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Figure 4
Comparison of a sample image (a) without any normalization, conventionally flat-field-corrected image (b) and dynamic flat-field-corrected data (c). Only the bottom section of the images [(50, 400) pixels and 0.16 mm × 1.28 mm field of view] is shown here from the originally sized images [(250, 400) pixels and 0.8 mm × 1.28 mm field of view].

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 6| November 2023| Pages 1030-1037

https://doi.org/10.1107/S1600577523007336

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