Online dynamic flat-field correction for MHz microscopy data at European XFEL

Birnsteinova, S.; Ferreira de Lima, D.E.; Sobolev, E.; Kirkwood, H.J.; Bellucci, V.; Bean, R.J.; Kim, C.; Koliyadu, J.C.P.; Sato, T.; Dall'Antonia, F.; Asimakopoulou, E.M.; Yao, Z.; Buakor, K.; Zhang, Y.; Meents, A.; Chapman, H.N.; Mancuso, A.P.; Villanueva-Perez, P.; Vagovič, P.

doi:10.1107/S1600577523007336

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 7
Comparison of the uncorrected sample image and flat-field-corrected images using the dynamical method with [2, 4, 10, 20, 40, 100] principal components. Only the bottom section of the images [(50, 400) pixels and 0.16 mm × 1.28 mm field of view] is shown here from originally sized images [(250, 400) pixels and 0.8 mm × 1.28 mm field of view].

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 6| November 2023| Pages 1030-1037

https://doi.org/10.1107/S1600577523007336

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page