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Figure 2
(a)–(e) Direct-space images on the checkerboard-pattered sample illuminated by an Hg lamp with various magnification settings and FoVs. (f) Table of magnification settings, corresponding FoVs and PEEM resolution with different extractor voltages. (g) Intensity profile along the edge of the Au patterns [dashed line marked in (e)] for estimating the PEEM resolution.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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