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Figure 3
Analysis methodology of diffraction patterns. (a) X-ray detector (raw) image of the {110} Debye Scherrer ring. (b) Masking of hot, dead and inter-modules double pixels of the image, transformation of the image in the azimuth and scattering angle coordinate system [for further details, see Ors et al. (2019BB24)]. (c) Azimuthal integration and fit of the diffraction peak with an asymmetric Pearson VII function.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 1| January 2024| Pages 17-27
https://doi.org/10.1107/S1600577523008767
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