Image registration for in situ X-ray nano-imaging of a composite battery cathode with deformation

Su, B.; Qian, G.; Gao, R.; Tao, F.; Zhang, L.; Du, G.; Deng, B.; Pianetta, P.; Liu, Y.

doi:10.1107/S1600577524000146

Journal of Synchrotron Radiation Journal of
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Figure 3
Analysis of the image alignment results of a synthetic dataset. (a) The image stack with enlarged ROI to illustrate the image distortion. (b) A comparison of the registration results from several different algorithms using differential maps. (c)–(f) Quantitative evaluation of the alignment results.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 2| March 2024| Pages 328-335

https://doi.org/10.1107/S1600577524000146

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