ForMAX – a beamline for multiscale and multimodal structural characterization of hierarchical materials

Nygård, K.; McDonald, S.A.; González, J.B.; Haghighat, V.; Appel, C.; Larsson, E.; Ghanbari, R.; Viljanen, M.; Silva, J.; Malki, S.; Li, Y.; Silva, V.; Weninger, C.; Engelmann, F.; Jeppsson, T.; Felcsuti, G.; Rosén, T.; Gordeyeva, K.; Söderberg, L.D.; Dierks, H.; Zhang, Y.; Yao, Z.; Yang, R.; Asimakopoulou, E.M.; Rogalinski, J.K.; Wallentin, J.; Villanueva-Perez, P.; Krüger, R.; Dreier, T.; Bech, M.; Liebi, M.; Bek, M.; Kádár, R.; Terry, A.E.; Tarawneh, H.; Ilinski, P.; Malmqvist, J.; Cerenius, Y.

doi:10.1107/S1600577524001048

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Figure 10
Zooming into hierarchical materials on ForMAX. Panel (a) shows a 2D slice from the reconstructed 3D volume of an aspen sapling with a magnified view into cellular structure in both tangential (a1) and radial directions (a2) as obtained by SRµCT. Such data provide microscopic structural characterization and allow users to identify regions of interest for nanoscale mapping. Panels (b) and (c)–(d) present local SAXS and WAXS data, respectively, acquired using an X-ray beam focused to ∼25 µm × 25 µm at the sample position. Panels (c) and (d) illustrate spatially resolved WAXS mapping of crystallites measured at different positions within the sample.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 2| March 2024| Pages 363-377

https://doi.org/10.1107/S1600577524001048

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