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Figure 6
Analysis of X-ray CMOS images of the optical laser pulses transmitted through the YAG crystal, registered for: (left column) irradiation with optical laser only and (right column) irradiation with optical pulses overlapped with XFEL pulses. (First row) Raw images with marked regions of interest (dashed line). (Middle row) CMOS images corrected for the background light and for the optical laser spatial distribution. (Last row) The data projected from the region of interest in the corrected images (regions marked with dashed lines). The data marked in red were shifted down for clarity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 2| March 2024| Pages 233-242
https://doi.org/10.1107/S1600577523010500
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