Submillisecond in situ X-ray diffraction measurement system with changing temperature and pressure using diamond anvil cells at BL10XU/SPring-8

Kawaguchi-Imada, S.; Sinmyo, R.; Ohta, K.; Kawaguchi, S.; Kobayashi, T.

doi:10.1107/S1600577523010974

Journal of Synchrotron Radiation Journal of
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Figure 1
Results of measuring focused X-rays using the knife-edge method. Black crosses, pink/light blue crosses and solid red/blue lines indicate the measured raw values, their derivatives and the Gaussian fitting results of derivatives, respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 2| March 2024| Pages 343-354

https://doi.org/10.1107/S1600577523010974

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