Combination of XEOL, TR-XEOL and HB-T interferometer at the TPS 23A X-ray nanoprobe for exploring quantum materials

Huang, T.-C.; Ke, S.-W.; Wu, Y.-H.; Wang, E.-R.; Wei, W.-L.; Lee, C.-Y.; Chen, B.-Y.; Yin, G.-C.; Chang, H.-W.; Tang, M.-T.; Lin, B.-H.

doi:10.1107/S1600577523010469

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Figure 4
The right-hand plots in panels (a), (b) and (c) show streak images using time windows of 1 µs, 12 ns and 2 ns, respectively; the left-hand plots represent the spectral integrated (366–376 nm) time traces of each streak image. (d) TR-XEOL spectra of a single bunch with different beam currents. The inset of (d) reveals that the emission peak intensity of TR-XEOL increases with an increase in the beam current.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 2| March 2024| Pages 252-259

https://doi.org/10.1107/S1600577523010469

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