Combination of XEOL, TR-XEOL and HB-T interferometer at the TPS 23A X-ray nanoprobe for exploring quantum materials

Huang, T.-C.; Ke, S.-W.; Wu, Y.-H.; Wang, E.-R.; Wei, W.-L.; Lee, C.-Y.; Chen, B.-Y.; Yin, G.-C.; Chang, H.-W.; Tang, M.-T.; Lin, B.-H.

doi:10.1107/S1600577523010469

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Figure 5
(a) XEOL map with λ_em = 575 nm. (b) XEOL spectra of areas P8 and P9 marked in (a). Streak image (c) and spectral integrated (570–578 nm) time traces (e) of P8, as well as the corresponding data for P9 shown in (d) and (f).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 2| March 2024| Pages 252-259

https://doi.org/10.1107/S1600577523010469

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