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Figure 4
(a) Top view of the spectrometer installed in the multiplex imaging chamber. Three components of the von Hamos spectrometer are indicated by arrows: (1) sample stage, (2) an Si crystal analyzer with a radius of curvature of 250 mm mounted on the stacked stages, (3) JUNGFRAU 0.5M. It is located next to the sample stage. The distance between the crystal plane and the detector plane is determined by the radius of curvature of the crystal analyzer. (b) Energy range measured by the spectrometer with Si(111) and Si(220) crystal analyzers. Because of the finite volume of the multiplex imaging chamber, the measurable energy range is restricted.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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