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Figure 6
Nanoscale morphological and optical analysis of PS-PVAc films. AFM topography (a) and respective synchrotron radiation IR broadband reflectivity (s-SNOM amplitude) at the third (b) and fourth (c) harmonics of the tip frequency. Scale bar represents 500 nm. (d) Near-field (NF) absorption spectra acquired at the blue and red dots indicated in (a). (e) AFM topography revealing fine details of the film's surface structures. Scale bar represents 200 nm. (f) NF absorption spectra (O—C=O stretching band) taken along the line in (e). (g) Spatial-spectral representation of the spectra taken along the line in (e).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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