view article
Figure 8
Nano-optical assessment of 2D hBN. (a)–(d) AFM topography of a ∼40 nm-thick hBN/SiO2 flake followed by synchrotron radiation IR broadband reflectivity maps at third, fourth and fifth tip harmonics. Scale bar represents 500 nm. (e) Nano-FTIR amplitude spectrum taken at the red dot in (a). (f) Spatio-spectral linescan along the white dashed line in (a).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 3| May 2024| Pages 547-556
https://doi.org/10.1107/S1600577524002364
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS