Figure 3
Raw Pt L3-edge XAFS of Pt/SiO2 obtained under different in situ conditions: (a) 350°C in N2, (b) 350°C 5% H2 in N2, (c) ambient temperature in N2, and (d) ambient temperature in 0.6% CO. For each condition, sample angles of 30°, 35°, 40°, and 45° were measured and plotted with the result of iterative Bragg peak removal (IBR-AIC). |