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![[Figure 2]](vl5019fig2mag.jpg)
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Figure 2
(a) Diffracted intensity of a Pt42.5Cu27Ni9.5P21 metallic glass, taken at 300 K and 1 atm at the ID15a beamline of ESRF. The range covered by the diffraction detector is shown by the blue dashed line. The range covered by the XPCS detector is indicated by the box on the first peak. (b) Scattered intensity after azimuthal integration of the scan-averaged intensity within the XPCS detector, considering all active pixels in the detector (orange solid line), or after masking the two large Kossel lines (green solid line). (c) The averaged two-dimensional pattern measured by the XPCS detector during a 700 s scan. (d) g2(q,Δt) functions obtained from the same scan, with and without masking the Kossel lines (full symbols), and the g2(q,Δt) function generated by the diamonds and PTM, obtained when aiming the X-ray beam out of the sample (dashed lines). The g2(q,Δt) function of a similar metallic glass obtained in a furnace is shown for comparison (empty symbols). |
![[Figure 2]](vl5019fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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