Figure 2
Simulation of the current induced by an ensemble of 40 keV photons in 750 µm-thick hole-collecting (dashed red line) and electron-collecting (solid blue line) CdTe sensors. The simulations were done using a charge collection area much wider than the sensor thickness. The experimental response shown in Figs. 6–8 was also computed by integrating the incident signal over a wide region of interest. |