view article
Figure 2
Schemes A and B depict the measurement of wavefront distortions during diffraction from a flat crystal sample (a) and a channel-cut crystal sample (b), respectively. The dashed lines illustrate the reference beam path when the crystal(s) and detector move to the dotted positions. Photograph (c) visualizes the DES system, while photograph (d) showcases the double-edge structure. The diffracted image (e) captures the result with a flat crystal sample in the beam path.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 5| September 2024| Pages 1146-1153
https://doi.org/10.1107/S1600577524006222
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS